Analysis of Interface Trap States Generated by the Self-Heating Effect in Highly Flexible Single-Crystalline Si Nanomembrane Transistors
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Bong, Jae Hoon | ko |
| dc.contributor.author | KIM, SEUNGYOON | ko |
| dc.contributor.author | Jeong, Chan Bae | ko |
| dc.contributor.author | Chang, Ki Soo | ko |
| dc.contributor.author | Hwang, Wan Sik | ko |
| dc.contributor.author | Cho, Byung-Jin | ko |
| dc.date.accessioned | 2018-03-21T01:56:05Z | - |
| dc.date.available | 2018-03-21T01:56:05Z | - |
| dc.date.created | 2018-02-27 | - |
| dc.date.created | 2018-02-27 | - |
| dc.date.issued | 2017-12-06 | - |
| dc.identifier.citation | 48th IEEE Semiconductor Interface Specialists Conference | - |
| dc.identifier.uri | http://hdl.handle.net/10203/240432 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Analysis of Interface Trap States Generated by the Self-Heating Effect in Highly Flexible Single-Crystalline Si Nanomembrane Transistors | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 48th IEEE Semiconductor Interface Specialists Conference | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Catamaran Resort Hotel, San Diego | - |
| dc.contributor.localauthor | Cho, Byung-Jin | - |
| dc.contributor.nonIdAuthor | Jeong, Chan Bae | - |
| dc.contributor.nonIdAuthor | Chang, Ki Soo | - |
| dc.contributor.nonIdAuthor | Hwang, Wan Sik | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.