DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Moon-Zoo | ko |
dc.contributor.author | Kim, Yun-Ho | ko |
dc.contributor.author | Choi, Yun-Ja | ko |
dc.date.accessioned | 2011-05-26T05:20:38Z | - |
dc.date.available | 2011-05-26T05:20:38Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2012-05 | - |
dc.identifier.citation | FORMAL ASPECTS OF COMPUTING, v.24, no.3, pp.355 - 374 | - |
dc.identifier.issn | 0934-5043 | - |
dc.identifier.uri | http://hdl.handle.net/10203/23902 | - |
dc.description.abstract | In today's information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully, it is essential that flash memory be controlled correctly through flash storage platform software such as the file system, flash translation layer, and low-level device drivers. However, as is typical for embedded software, conventional testing methods often fail to detect hidden flaws in the software due to the difficulty of creating effective test cases. As a different approach, model checking techniques guarantee a complete analysis, but only on a limited scale. In this paper, we describe an empirical study wherein a concolic testing method is applied to the multi-sector read operation for flash storage platform software. This method combines a concrete dynamic execution and a symbolic execution to automatically generate test cases for full path coverage. Through the experiments, we analyze the advantages and weaknesses of the concolic testing approach on the flash storage platform software. | - |
dc.description.sponsorship | We would like to thank Hotae Kim at Samsung Electronics for his valuable discussion on the environment models for flash file systems. This work was supported by the Engineering Research Center of Excellence Program of Korea Ministry of Education, Science and Technology(MEST)/ National Research Foundation of Korea(NRF) (grant number 2010-0001727) and the MKE(Ministry of Knowledge Economy), Korea, under the ITRC(Information Technology Research Center) support program supervised by NIPA(National IT Industry Promotion Agency) (NIPA-2009-(C1090- 0902-0032)). | en |
dc.language | English | - |
dc.language.iso | en_US | en |
dc.publisher | SPRINGER | - |
dc.subject | MODEL | - |
dc.title | Concolic testing of the multi-sector read operation for flash storage platform software | - |
dc.type | Article | - |
dc.identifier.wosid | 000303585300005 | - |
dc.identifier.scopusid | 2-s2.0-84861570295 | - |
dc.type.rims | ART | - |
dc.citation.volume | 24 | - |
dc.citation.issue | 3 | - |
dc.citation.beginningpage | 355 | - |
dc.citation.endingpage | 374 | - |
dc.citation.publicationname | FORMAL ASPECTS OF COMPUTING | - |
dc.identifier.doi | 10.1007/s00165-011-0200-9 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kim, Moon-Zoo | - |
dc.contributor.nonIdAuthor | Choi, Yun-Ja | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Flash memory | - |
dc.subject.keywordAuthor | concolic testing | - |
dc.subject.keywordAuthor | unit analysis | - |
dc.subject.keywordAuthor | and embedded software verification | - |
dc.subject.keywordPlus | MODEL | - |
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