DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, Jin Ho | ko |
dc.contributor.author | Kwon, Youngsu | ko |
dc.contributor.author | Shin, Kyeongsun | ko |
dc.contributor.author | Yoo, Hoi-Jun | ko |
dc.date.accessioned | 2018-01-30T04:22:13Z | - |
dc.date.available | 2018-01-30T04:22:13Z | - |
dc.date.created | 2018-01-08 | - |
dc.date.created | 2018-01-08 | - |
dc.date.created | 2018-01-08 | - |
dc.date.issued | 2017-10 | - |
dc.identifier.citation | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.17, no.5, pp.627 - 635 | - |
dc.identifier.issn | 1598-1657 | - |
dc.identifier.uri | http://hdl.handle.net/10203/238838 | - |
dc.description.abstract | The processor is becoming increasingly susceptible to transient faults with fluctuating voltage, widening operating temperature, and increasing clock frequency. Especially, processor, operating near threshold voltage for a low power, can expose to transient faults with the thin margin of process, voltage, and temperature. This paper presents a fault tolerant processor having on-chip fault monitor systems for processor core and cache, which detects faults and corrects faults, and a fault injector which injects faults for testing. The fault tolerant feature is analyzed by a fault injection and quantitative analysis complying with ISO26262 standard. As a result, the proposed work achieves 80 mu W/MHz energy efficiency, 850 MHz maximum frequency, 72% fault trap reduction, and 99.23% single point fault failure rate complying with ISO26262. | - |
dc.language | English | - |
dc.publisher | IEEK PUBLICATION CENTER | - |
dc.title | 80 mu W/MHz, 850 MHz Fault Tolerant Processor with Fault Monitor Systems | - |
dc.type | Article | - |
dc.identifier.wosid | 000418493700008 | - |
dc.identifier.scopusid | 2-s2.0-85032798839 | - |
dc.type.rims | ART | - |
dc.citation.volume | 17 | - |
dc.citation.issue | 5 | - |
dc.citation.beginningpage | 627 | - |
dc.citation.endingpage | 635 | - |
dc.citation.publicationname | JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE | - |
dc.identifier.doi | 10.5573/JSTS.2017.17.5.627 | - |
dc.contributor.localauthor | Yoo, Hoi-Jun | - |
dc.contributor.nonIdAuthor | Kwon, Youngsu | - |
dc.contributor.nonIdAuthor | Shin, Kyeongsun | - |
dc.description.isOpenAccess | N | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Fault tolerant processor | - |
dc.subject.keywordAuthor | fault monitor | - |
dc.subject.keywordAuthor | ISO26262 | - |
dc.subject.keywordAuthor | fault injection | - |
dc.subject.keywordAuthor | near threshold voltage | - |
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