80 mu W/MHz, 850 MHz Fault Tolerant Processor with Fault Monitor Systems

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dc.contributor.authorHan, Jin Hoko
dc.contributor.authorKwon, Youngsuko
dc.contributor.authorShin, Kyeongsunko
dc.contributor.authorYoo, Hoi-Junko
dc.date.accessioned2018-01-30T04:22:13Z-
dc.date.available2018-01-30T04:22:13Z-
dc.date.created2018-01-08-
dc.date.created2018-01-08-
dc.date.created2018-01-08-
dc.date.issued2017-10-
dc.identifier.citationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.17, no.5, pp.627 - 635-
dc.identifier.issn1598-1657-
dc.identifier.urihttp://hdl.handle.net/10203/238838-
dc.description.abstractThe processor is becoming increasingly susceptible to transient faults with fluctuating voltage, widening operating temperature, and increasing clock frequency. Especially, processor, operating near threshold voltage for a low power, can expose to transient faults with the thin margin of process, voltage, and temperature. This paper presents a fault tolerant processor having on-chip fault monitor systems for processor core and cache, which detects faults and corrects faults, and a fault injector which injects faults for testing. The fault tolerant feature is analyzed by a fault injection and quantitative analysis complying with ISO26262 standard. As a result, the proposed work achieves 80 mu W/MHz energy efficiency, 850 MHz maximum frequency, 72% fault trap reduction, and 99.23% single point fault failure rate complying with ISO26262.-
dc.languageEnglish-
dc.publisherIEEK PUBLICATION CENTER-
dc.title80 mu W/MHz, 850 MHz Fault Tolerant Processor with Fault Monitor Systems-
dc.typeArticle-
dc.identifier.wosid000418493700008-
dc.identifier.scopusid2-s2.0-85032798839-
dc.type.rimsART-
dc.citation.volume17-
dc.citation.issue5-
dc.citation.beginningpage627-
dc.citation.endingpage635-
dc.citation.publicationnameJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE-
dc.identifier.doi10.5573/JSTS.2017.17.5.627-
dc.contributor.localauthorYoo, Hoi-Jun-
dc.contributor.nonIdAuthorKwon, Youngsu-
dc.contributor.nonIdAuthorShin, Kyeongsun-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorFault tolerant processor-
dc.subject.keywordAuthorfault monitor-
dc.subject.keywordAuthorISO26262-
dc.subject.keywordAuthorfault injection-
dc.subject.keywordAuthornear threshold voltage-
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