Analysis of heavy-metal ions using mercury microelectrodes and a solid-state reference electrode on a Si wafer

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dc.contributor.authorYun, KSko
dc.contributor.authorKim, HJko
dc.contributor.authorJoo, Sko
dc.contributor.authorKwak, Juhyounko
dc.contributor.authorYoon, Eko
dc.date.accessioned2011-05-24T08:16:29Z-
dc.date.available2011-05-24T08:16:29Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2000-12-
dc.identifier.citationJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.12B, pp.7159 - 7163-
dc.identifier.issn0021-4922-
dc.identifier.urihttp://hdl.handle.net/10203/23872-
dc.description.abstractMicro working electrodes and a solid-state reference electrode have been fabricated using semiconductor processes for electrochemical detection of heavy-metal ions in aqueous media. The working electrodes are mercury-coated platinum microelectrodes 5 mum, 10 mum and 25 mum in diameter, The smaller electrode shows the higher sensitivity and the detection limits of the 5-mum-diameter electrodes are about 0.2 ppb and 0.4 ppb for cadmium and lead ions, respectively. The reference electrode is a Ag/AgCl electrode coated by polyvinyl chloride (PVC)/Nafion layer containing Cl- ions. The potential variation of the fabricated solid-state reference electrodes is about 55 mV under a 0.1 M Cl- concentration.-
dc.description.sponsorshipThis work was supported in part by the Korea Science and Engineering Foundation through the MICROS center at KAIST and the BK21 project, Korea.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherINST PURE APPLIED PHYSICS-
dc.subjectULTRAMICROELECTRODES-
dc.titleAnalysis of heavy-metal ions using mercury microelectrodes and a solid-state reference electrode on a Si wafer-
dc.typeArticle-
dc.identifier.wosid000166820200081-
dc.identifier.scopusid2-s2.0-0034430663-
dc.type.rimsART-
dc.citation.volume39-
dc.citation.issue12B-
dc.citation.beginningpage7159-
dc.citation.endingpage7163-
dc.citation.publicationnameJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKwak, Juhyoun-
dc.contributor.localauthorYoon, E-
dc.contributor.nonIdAuthorYun, KS-
dc.contributor.nonIdAuthorKim, HJ-
dc.contributor.nonIdAuthorJoo, S-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthormicroelectrode-
dc.subject.keywordAuthorsolid-state reference electrode-
dc.subject.keywordAuthorheavy-metal-ion-
dc.subject.keywordAuthorstripping voltammetry-
dc.subject.keywordAuthorSWASV-
dc.subject.keywordAuthormercury electrode-
dc.subject.keywordAuthormicrofabrication-
dc.subject.keywordPlusULTRAMICROELECTRODES-
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