Browse "RIMS Collection" by Subject Zinc oxynitride (ZnON)
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| The effects of active layer thickness and annealing conditions on the electrical performance of ZnON thin-film transistors Park, Jozeph; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Park, Yun Chang; Kim, Hyun-Suk, JOURNAL OF ALLOYS AND COMPOUNDS, v.688, pp.666 - 671, 2016-12 |
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