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OBSERVATION OF DEFECTS AND GROWTH ORIENTATIONS OF YBA2CU3OX THIN-FILMS WITH YSZ BUFFER LAYERS ON SI HWANG, DS; LEE, SG; PARK, YK; Chun , Soung Soon; PARK, JC, PHYSICA C, v.250, no.3-4, pp.375 - 381, 1995-08 |
The effect of solvent water content on the dielectric properties of Al2O3 films grown by atmospheric pressure mist-CVD Kim, Dong-Hyun; Jeong, Hyun-Jun; Park, Jozeph; Park, Jin-Seong, CERAMICS INTERNATIONAL, v.44, no.1, pp.459 - 463, 2018-01 |
The growth behavior and properties of atomic layer deposited zinc oxide films using hydrogen peroxide (H2O2) and ozone (O-3) oxidants Park, J.; Jung, Tae-Hoon; Lee, Jung-Hoon; Kim, Hyun-Suk; Park, Jin-Seong, CERAMICS INTERNATIONAL, v.41, no.1, pp.1839 - 1845, 2015-01 |
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