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ELECTRON YIELD XAFS STUDY OF EVAPORATED CO/PD MULTILAYERS WITH VARIOUS THICKNESS RATIOS OF CO TO PD SUBLAYERS - SIMULATIONS OF THE CO K-EDGE XAFS AND FOURIER-TRANSFORMS

CHOI, M; JOO, JH; Kim, Sang-Koog; KANG, JS; LEE, YP; Shin, Sung-Chul; HEALD, SM, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.32, pp.410 - 412, 1993

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