Browse "RIMS Collection" by Subject ELECTRICAL-PROPERTIES

Showing results 1 to 7 of 7

1
A physical-based analytical turn-on model of polysilicon thin-film transistors for circuit simulation

Yang, GY; Hur, SH; Han, Chul-Hi, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.46, no.1, pp.165 - 172, 1999-01

2
Dependence of the microstructural properties on the substrate temperature in strained CdTe (100)/GaAs (100) heterostructures

Lee K.H.; Jung J.H.; Kim T.W.; Lee H.S.; Park H.L., APPLIED SURFACE SCIENCE, v.253, no.20, pp.8470 - 8473, 2007

3
Highly durable solid oxide fuel cells: suppressing chemical degradation via rational design of a diffusion-blocking layer

Lee, Seunghwan; Lee, Sanghyeok; Kim, Hyo-Jin; Choi, Sung Min; An, Hyegsoon; Park, Mi Young; Shin, Jisu; et al, JOURNAL OF MATERIALS CHEMISTRY A, v.6, no.31, pp.15083 - 15094, 2018-08

4
Indium oxide thin film prepared by low temperature atomic layer deposition using liquid precursors and ozone oxidant

Maeng, W. J.; Choi, Dong-Won; Park, Jozeph; Park, Jin-Seong, JOURNAL OF ALLOYS AND COMPOUNDS, v.649, pp.216 - 221, 2015-11

5
Performance and Stability Enhancement of In-Sn-Zn-O TFTs Using SiO2 Gate Dielectrics Grown by Low Temperature Atomic Layer Deposition

Sheng, Jiazhen; Han, Ju-Hwan; Choi, Wan-Ho; Park, Jozeph; Park, Jin-Seong, ACS APPLIED MATERIALS & INTERFACES, v.9, no.49, pp.42928 - 42934, 2017-12

6
Tunable polarization-drived superior energy storage performance in PbZrO3 thin films

Zhang, Tiandong; Shi, Zhuangzhuang; Yin, Chao; Zhang, Changhai; Zhang, Yue; Zhang, Yongquan; Chen, Qingguo; et al, JOURNAL OF ADVANCED CERAMICS, v.12, no.5, pp.930 - 942, 2023-05

7
X-ray photoelectron spectroscopy of Sm-doped layered perovskite for intermediate temperature-operating solid oxide fuel cell

Kim, Yongmin; Schlegl, Harald; Kim, Keunsoo; Irvine, John T. S.; Kim, Jung Hyun, APPLIED SURFACE SCIENCE, v.288, pp.695 - 701, 2014-01

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