Browse "RIMS Collection" by Author Yunhyeok I.

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Development of junction temperature decision (JTD) map for thermal design of nano-scale devices considering leakage power

Yunhyeok I.; Eun S.C.; Kiwon C.; Sayoon K., 23rd Annual IEEE Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM, pp.63 - 67, 2007-03-18

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