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Browse "RIMS Collection" by Author W.M.Huang

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1	A Simple Technique to Measure Generation Lifetime in Partially Depleted SOI MOSFET's Hyungcheol Shin; M. Racanelli; W.M.Huang; J. Foerstner; Seokjin Choi; D.K.Schroder, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.45, no.11, pp.2378 - 2380, 1998-11

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