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Browse "RIMS Collection" by Author Shin, Jang-Kyoo

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Showing results 1 to 6 of 6

1	Analysis of Disparity Information for Depth Extraction Using CMOS Image Sensor with Offset Pixel Aperture Technique Choi, Byoung-Soo; Lee, Jimin; Kim, Sang-Hwan; Chang, Seunghyuk; Park, JongHo; Lee, Sang-Jin; Shin, Jang-Kyoo, SENSORS, v.19, no.3, 2019-02
2	CMOS image sensor using pixel aperture technique for single-chip 2D and 3D imaging Choi, Byoung-Soo; Kim, Sang-Hwan; Lee, Jimin; Chang, Seunghyuk; Park, Jongho; Lee, Sang-Jin; Shin, Jang-Kyoo, 16th IEEE SENSORS Conference, ICSENS 2017, pp.1 - 3, Institute of Electrical and Electronics Engineers Inc., 2017-10
3	CMOS image sensor with off-center circular apertures for depth extraction Choi, Byoung-Soo; Lee, Jimin; Kim, Sang-Hwan; Lee, Jewon; Lee, Junwoo; Chang, Seunghyuk; Park, JongHo; et al, Conference on Image Sensing Technologies - Materials, Devices, Systems, and Applications VI, SPIE-INT SOC OPTICAL ENGINEERING, 2019-04
4	Effects of Aperture Diameter on Image Blur of CMOS Image Sensor With Pixel Apertures Choi, Byoung-Soo; Kim, Sang-Hwan; Lee, Jimin; Seong, Donghyun; Lee, Jewon; Lee, Junwoo; Chang, Seunghyuk; et al, IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.68, no.5, pp.1382 - 1388, 2019-05
5	Effects of light intensity on disparity for depth extraction in monochrome CMOS image sensor with offset pixel apertures Lee, Jimin; Kim, Sang-Hwan; Chang, Seunghyuk; Park, JongHo; Lee, Sang-Jin; Shin, Jang-Kyoo, 22nd Annual Conference for Novel Optical Systems, Methods, and Applications 2019, SPIE, 2019-08
6	Extraction of depth information for 3D imaging using pixel aperture technique Choi, Byoung-Soo; Bae, Myunghan; Kim, Sang-Hwan; Lee, Jimin; Oh, Chang-Woo; Chang, Seunghyuk; Park, Jongho; et al, Photonic Instrumentation Engineering IV, SPIE, 2017-01

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