Browse "RIMS Collection" by Author Nahm, Ho-Hyun
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| Improved field effect mobility and stability of indium-free oxide thin film transistor by metal capping layer Park, Ji-Min; Nahm, Ho-Hyun; Kim, Hyun-Suk, 26th International Display Workshops, IDW 2019, pp.563 - 566, International Display Workshops, 2019-11 |
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