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Effects of Annealing and Oxidation on the Properties of Tungsten Polycide Films S.H.Hong; J.H.Lee; C.M.Lee; H.B.Im, 전기전자재료학회논문지, v.3, pp.235, 1990 |
Effects of Annealing of WSi2 in Polycide Structure Formed by LPCVD Method J.H.Lee; H.B.Im; C.M.Lee, 전기전자재료학회논문지, v.4, pp.263, 1990 |
Sidewall Effects in Oxide-Walled Emitter Bipolar Transistors C.H.Han; J.S.Park; H.S.Rhee; J.H.Lee, KITE JOURNAL OF ELECTRONICS ENGINEERING, v.3, no.2, pp.28 - 33, 1992-11 |
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