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A Simple Technique to Measure Generation Lifetime in Partially Depleted SOI MOSFET's Hyungcheol Shin; M. Racanelli; W.M.Huang; J. Foerstner; Seokjin Choi; D.K.Schroder, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.45, no.11, pp.2378 - 2380, 1998-11 |
Thin Film Silicon on Insulator on Insulator Substractes and Their Application to Integrated Circuits S. R. Wilson; T. Wetteroth; S. Hong; H. Shin; B-Y. Hwang; J. Foerstner; M. Racanelli; et al, JOURNAL OF ELECTRONIC MATERIALS, v.25, no.1, pp.13 - 21, 1996-01 |
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