Browse "RIMS Collection" by Author Hwang, T
Showing results 1 to 3 of 3
| A nano-structure memory with SOI edge channel Park, G; Han, S; Hwang, T; Shin, Hyung-Cheol, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.35, pp.S1003 - S1006, 1999-12 |
| Measurement of carrier generation lifetime in SOI devices Shin, Hyung-Cheol; Racanelli, M; Huang, WM; Foerstner, J; Hwang, T; Schroder, DK, SOLID-STATE ELECTRONICS, v.43, no.2, pp.349 - 353, 1999-02 |
| Thermally grown thin nitride films as a gate dielectric Shin, H; Choi, S; Hwang, T; Lee, Kwyro, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.33, pp.175 - 178, 1998-11 |
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