Browse "RIMS Collection" by Author Amit, Iddo
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| Barrier Height Measurement of Metal Contacts to Si Nanowires Using Internal Photoemission of Hot Carriers Yoon, KunHo; Hyun, Jerome K.; Connell, Justin G.; Amit, Iddo; Rosenwaks, Yossi; Lauhon, Lincoln J., NANO LETTERS, v.13, no.12, pp.6183 - 6188, 2013-12 |
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