Showing results 24 to 25 of 25
Phase-Contrast Latent Image Metrology for Microlithography Euisik Yoon, Proc. SPIE, pp.580 - 591, 1992 |
Suppression of Grain Growth and Surface Roughness of MOCVD Ta2O5 Films in a Stacked Gate Structure Euisik Yoon, Extended Abstact of Electrochem. Soc. Meeting, pp.253 - 254, 1993 |
Discover