Browse "RIMS Collection" by Author Park Y.
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The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible Process Jang M.; Park Y.; Jun M.; Hyun Y.; Choi S.-J.; Zyung T., NANOSCALE RESEARCH LETTERS, v.5, no.10, pp.1654 - 1657, 2010 |
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