Browse "RIMS Collection" by Author Ichikawa, O.
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| Impact of metal gate electrodes on electrical properties of InGaAs MOS gate stacks Chang, C-Y; Yokoyama, M.; Kim, S-H; Ichikawa, O.; Osada, T.; Hata, M.; Takenaka, M.; et al, MICROELECTRONIC ENGINEERING, v.109, pp.28 - 30, 2013-09 |
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