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The effect of Ge addition on the RESET operation of a phase-change memory (PCM) device using Ge-doped SbTe Park Y.-w.; Lee H.S.; Ahn H.W.; Wu Z.; Lee S.; Jeong J.-h.; Jeong D.S.; et al, CURRENT APPLIED PHYSICS, v.10, no.1, pp.E79 - E82, 2010 |
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