Browse "RIMS Collection" by Title 

Showing results 5341 to 5360 of 11470

5341
ORIGIN OF UNKNOWN X-RAY-DIFFRACTION PEAKS FROM INCOMMENSURATE SUPERLATTICES

Kim, Sang-Koog; CHANG, CH; LEE, YP; KOO, YM, JOURNAL OF APPLIED PHYSICS, v.77, no.1, pp.423 - 425, 1995-01

5342
Origins of perpendicular magnetic anisotropy in Ni/Pd multilayer films

Jeong, JR; Kim, YS; Shin, Sung-Chul, JOURNAL OF APPLIED PHYSICS, v.85, no.8, pp.5762 - 5764, 1999-04

5343
Oscillatory magnetic anisotropy in Fe/Cr/Fe trilayers

Kim, KY; Kim, DH; Shin, Sung-Chul; You, CY, JOURNAL OF APPLIED PHYSICS, v.95, pp.6867 - 6869, 2004-06

5344
OSCILLATORY TRANSPORT BEHAVIOR IN COMPOSITIONALLY MODULATED PBTE-BI FILMS

Shin, Sung-Chul, PHYSICS LETTERS A, v.108, no.9, pp.465 - 467, 1985-04

5345
Others Are to Blame: Whom People Consider Responsible for Online Misinformation

Lima, Gabriel; Han, Jiyoung; Cha, Meeyoung, Proceedings of the ACM on Human-Computer Interaction, v.6, no.CSCW1, 2022-04

5346
Others Are to Blame: Whom People Consider Responsible for Online Misinformation

Lima, Gabriel; Han, Jiyoung; Cha, Meeyoung, the ACM on Human-Computer Interaction (CSCW 2022), pp.1 - 25, Association for Computing Machinery (ACM), 2022-11-10

5347
Out-of-plane piezoresponse of monolayer MoS2 on plastic substrates enabled by highly uniform and layer-controllable CVD

Seo, Jeongdae; Kim, Youngjun; Park, Woon Yong; Son, Jong Yeog; Jeong, Chang Kyu; Kim, Hyungjun; Kim, Woo-Hee, APPLIED SURFACE SCIENCE, v.487, pp.1356 - 1361, 2019-09

5348
Overall Design Requirement of Broadband ATM Network

Choi, J. K.; Choi, MunKee; Chung, T. S.; Shin, Y. S.; Kim, K. S., INFOCOM 1991, IEEE, 1991-04-07

5349
Overestimation of Oxide Defects Density in Large Test Capacitors Due to Plasma Processing

Shin, Hyung-Cheol; Je, Minkyu; Hu, Chenming, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.44, no.9, pp.1554 - 1556, 1997-09

5350
Overlapping Community Detection in Massive Social Networks

Whang, Joyce Jiyoung, UT Digital Repository, pp.1 - 149, 2015-12

5351
Overnight returns, daytime reversals, and anchoring bias

Kim, Donghoon; Goh, Jihoon, Applied Economics Letters, pp.1 - 5, ACCEPT

5352
Overview of Electromagnetic Representation and Interpretation of Sign Language Semantics

He, Haizhuo; Chu, Hongjun; Pan, Rui; Ye, Linting; Zhang, Kang; Chen, Weichu; Zhang, Peng; et al, 9th IEEE MTT-S International Wireless Symposium, IWS 2022, Institute of Electrical and Electronics Engineers Inc., 2022-08

5353
Overview of Global Developments of the Machinery Industries: Strategic Directions & Options for Asian Countries

Park, Sang Chan, APO Study Meeting on Strategic Industries - Machinery Industries, 2005

5354
Ownership Structure and the Survival of Listed Firms: Evidence from Korean Reverse Mergers

Han, Seung Hun; Kwon, Yonghyun, ASIA-PACIFIC JOURNAL OF FINANCIAL STUDIES, v.44, no.3, pp.387 - 420, 2015-06

5355
Oxidation behavior of sintered tubular silicon carbide in pure steam I: Experiments

Lee, Youho; McKrell, Thomas J.; Montecot, Aline; Pantano, Michael; Song, Yann; Kazimi, Mujid S., CERAMICS INTERNATIONAL, v.42, no.1, pp.1916 - 1925, 2016-01

5356
Oxidation behavior of sintered tubular silicon carbide in pure steam II: Weight-loss correlation developments

Lee, Youho; McKrell, Thomas J.; Kazimi, Mujid S., CERAMICS INTERNATIONAL, v.42, no.4, pp.4679 - 4689, 2016-03

5357
Oxidation effect on densification of CuInS2 absorber layer by paste coating

Lee S.-Y.; Kim K.-H.; Park B.-O., THIN SOLID FILMS, v.516, no.15, pp.4709 - 4712, 2008

5358
Oxidation of hot-pressed silicon carbide in the cyclic and static conditions

Park, SC; Cho, Kurn; Kim, JJ, JOURNAL OF MATERIALS SCIENCE LETTERS, v.17, no.1, pp.23 - 25, 1998-01

5359
Oxidation of polysilicon using ECR N2O plasma oxidation and its application for poly-Si TFTs

한철희, 제3회 반도체 학술대회, pp.195 - 198, 1996

5360
Oxidation of Silicon Using Electron Cyclotron Resonance Nitrous Oxide Plasma and Its Application to Polycrystalline Silicon Thin Film Transistors

jin-woo lee; nae-in lee; sung-hoi hur; chul-hi han, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.144, no.9, pp.3283 - 3287, 1997-09

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