Showing results 1 to 1 of 1
A study on the competition between bias-induced charge trapping and light-induced instability in In-Ga-Zn-O thin-film transistors Park, Jozeph; Nguyen Dinh Trung; Kim, Yang Soo; Kim, Jong Heon; Park, Kyung; Kim, Hyun-Suk, JOURNAL OF ELECTROCERAMICS, v.36, no.1-4, pp.135 - 140, 2016-06 |
Discover