BACKSCATTERING MEASUREMENT OF BENDING-INDUCED BIREFRINGENCE IN SINGLE-MODE FIBERS
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Byoung Yoon | ko |
| dc.contributor.author | CHOI, SS | ko |
| dc.date.accessioned | 2011-04-21T02:07:52Z | - |
| dc.date.available | 2011-04-21T02:07:52Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1981 | - |
| dc.identifier.citation | ELECTRONICS LETTERS, v.17, no.5, pp.193 - 194 | - |
| dc.identifier.issn | 0013-5194 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/23306 | - |
| dc.language | English | - |
| dc.language.iso | en_US | en |
| dc.publisher | IEE-INST ELEC ENG | - |
| dc.title | BACKSCATTERING MEASUREMENT OF BENDING-INDUCED BIREFRINGENCE IN SINGLE-MODE FIBERS | - |
| dc.type | Article | - |
| dc.identifier.wosid | A1981LV20900012 | - |
| dc.identifier.scopusid | 2-s2.0-0019873168 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 17 | - |
| dc.citation.issue | 5 | - |
| dc.citation.beginningpage | 193 | - |
| dc.citation.endingpage | 194 | - |
| dc.citation.publicationname | ELECTRONICS LETTERS | - |
| dc.identifier.doi | 10.1049/el:19810136 | - |
| dc.embargo.liftdate | 9999-12-31 | - |
| dc.embargo.terms | 9999-12-31 | - |
| dc.contributor.localauthor | Kim, Byoung Yoon | - |
| dc.contributor.nonIdAuthor | CHOI, SS | - |
| dc.type.journalArticle | Article | - |
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