내부 지터 발생기를 이용한 온칩의 지터 저항력 측정기Internal jitter tolerance tester with an internal jitter generator
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 배현민 | ko |
| dc.contributor.author | 이준영 | ko |
| dc.contributor.author | 박진호 | ko |
| dc.contributor.author | 김태호 | ko |
| dc.date.accessioned | 2017-12-20T09:10:13Z | - |
| dc.date.available | 2017-12-20T09:10:13Z | - |
| dc.date.issued | 2015-06-23 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/232123 | - |
| dc.title | 내부 지터 발생기를 이용한 온칩의 지터 저항력 측정기 | - |
| dc.title.alternative | Internal jitter tolerance tester with an internal jitter generator | - |
| dc.type | Patent | - |
| dc.type.rims | PAT | - |
| dc.contributor.localauthor | 배현민 | - |
| dc.contributor.nonIdAuthor | 이준영 | - |
| dc.contributor.nonIdAuthor | 박진호 | - |
| dc.contributor.nonIdAuthor | 김태호 | - |
| dc.contributor.assignee | KAIST | - |
| dc.identifier.iprsType | 특허 | - |
| dc.identifier.patentApplicationNumber | 14070249 | - |
| dc.identifier.patentRegistrationNumber | 9065653 | - |
| dc.date.application | 2013-11-01 | - |
| dc.date.registration | 2015-06-23 | - |
| dc.publisher.country | US | - |
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