DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Dai Gil | ko |
dc.contributor.author | Kim, Seong Su | ko |
dc.contributor.author | Kim, Byung-Chul | ko |
dc.contributor.author | Park, Dong-Chang | ko |
dc.date.accessioned | 2017-12-20T01:59:14Z | - |
dc.date.available | 2017-12-20T01:59:14Z | - |
dc.identifier.uri | http://hdl.handle.net/10203/230132 | - |
dc.description.abstract | A probe card is used in conducting a visual test for a target test object through simultaneous contact of the probe card with each and every electrode pad of the target test object. The probe card includes a plurality of probes composed of conductive wire strands and having elastically deformable contact parts so curved as to make contact with electrode pads of a target test object. The contact parts are oriented in one and the same direction and extend in a parallel relationship with one another. The probe card further includes a first insulating block for fixedly securing one end parts of the probes, a second insulating block for fixedly securing the other end parts of the probes and a mounting plate for holding the first and second insulating blocks in such a manner that the contact parts of the probes protrude outwardly. | - |
dc.title | Probe card and method for producing the same | - |
dc.title.alternative | 프로브 카드 및 그 제조방법 | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | Lee, Dai Gil | - |
dc.contributor.nonIdAuthor | Kim, Seong Su | - |
dc.contributor.nonIdAuthor | Kim, Byung-Chul | - |
dc.contributor.nonIdAuthor | Park, Dong-Chang | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 11287455 | - |
dc.identifier.patentRegistrationNumber | 7248064 | - |
dc.date.application | 2005-11-28 | - |
dc.date.registration | 2007-07-24 | - |
dc.publisher.country | US | - |
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