DC Field | Value | Language |
---|---|---|
dc.contributor.author | Moon, Jaekyun | ko |
dc.contributor.author | No, Jaehyeong | ko |
dc.contributor.author | Choi, Seok Hwan | ko |
dc.contributor.author | Yang, Joong Seob | ko |
dc.contributor.author | Chang, Seung Ho | ko |
dc.contributor.author | Kim, Sang Sik | ko |
dc.contributor.author | Lee, Sang Chul | ko |
dc.contributor.author | Lee, Ho Yeon | ko |
dc.date.accessioned | 2017-12-20T01:13:34Z | - |
dc.date.available | 2017-12-20T01:13:34Z | - |
dc.date.issued | 2014-08-26 | - |
dc.identifier.uri | http://hdl.handle.net/10203/229325 | - |
dc.description.abstract | A method for estimating channel characteristics of a nonvolatile memory device including a plurality of memory cells includes the steps of: calculating first threshold voltage distributions of the memory cells programmed according to input data, based on the input data and a physical structure of the memory cells; calculating second threshold voltage distributions of the memory cells, based on output data and the physical structure of the memory cells; and analyzing the relation between the first and second threshold voltage distributions, using a mask. | - |
dc.title | Method for estimating channel characteristics of nonvolatile memory device | - |
dc.title.alternative | 비활성 메모리소자의 하도 특성치를 추정하기 위한 방법 | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | Moon, Jaekyun | - |
dc.contributor.nonIdAuthor | No, Jaehyeong | - |
dc.contributor.nonIdAuthor | Choi, Seok Hwan | - |
dc.contributor.nonIdAuthor | Yang, Joong Seob | - |
dc.contributor.nonIdAuthor | Chang, Seung Ho | - |
dc.contributor.nonIdAuthor | Kim, Sang Sik | - |
dc.contributor.nonIdAuthor | Lee, Sang Chul | - |
dc.contributor.nonIdAuthor | Lee, Ho Yeon | - |
dc.contributor.assignee | KAIST, SK Hynix Inc. | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 13767598 | - |
dc.identifier.patentRegistrationNumber | 8817561 | - |
dc.date.application | 2013-02-14 | - |
dc.date.registration | 2014-08-26 | - |
dc.publisher.country | US | - |
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