DC Field | Value | Language |
---|---|---|
dc.contributor.author | 권인소 | ko |
dc.contributor.author | 하효원 | ko |
dc.contributor.author | 박재식 | ko |
dc.date.accessioned | 2017-12-20T01:07:55Z | - |
dc.date.available | 2017-12-20T01:07:55Z | - |
dc.date.issued | 2017-07-31 | - |
dc.identifier.uri | http://hdl.handle.net/10203/229275 | - |
dc.title | 한 장의 컬러 코딩된 이상 패턴을 이용한 3차원 깊이 및 반사율 측정 방법 | - |
dc.title.alternative | METHOD FOR ACQUIRING THREE DIMENSIONAL IMAGE INFORMATION, AND COMPUTING DEVICE IMPLEMENTING THE SAMEMETHOD | - |
dc.type | Patent | - |
dc.type.rims | PAT | - |
dc.contributor.localauthor | 권인소 | - |
dc.contributor.nonIdAuthor | 하효원 | - |
dc.contributor.nonIdAuthor | 박재식 | - |
dc.contributor.assignee | KAIST | - |
dc.identifier.iprsType | 특허 | - |
dc.identifier.patentApplicationNumber | 10-2016-0103191 | - |
dc.identifier.patentRegistrationNumber | 10-1765257-0000 | - |
dc.date.application | 2016-08-12 | - |
dc.date.registration | 2017-07-31 | - |
dc.publisher.country | KO | - |
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