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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Robust feature matching for loop closing and localization

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dc.contributor.authorKim, J.ko
dc.contributor.authorKweon, In-Soko
dc.date.accessioned2011-03-07T05:10:39Z-
dc.date.available2011-03-07T05:10:39Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2007-10-29-
dc.identifier.citation2007 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2007, pp.3905 - 3910-
dc.identifier.urihttp://hdl.handle.net/10203/22443-
dc.description.sponsorshipThis work was supported in part by MIC && IITA through IT Leading R&D Support Project.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEEE-
dc.titleRobust feature matching for loop closing and localization-
dc.typeConference-
dc.identifier.wosid000254073202164-
dc.identifier.scopusid2-s2.0-51349108244-
dc.type.rimsCONF-
dc.citation.beginningpage3905-
dc.citation.endingpage3910-
dc.citation.publicationname2007 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2007-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Diego, CA-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKweon, In-So-
dc.contributor.nonIdAuthorKim, J.-
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EE-Conference Papers(학술회의논문)
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