Measuring and improving latency to avoid test suite wear out

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dc.contributor.authorYoo, Shinko
dc.contributor.authorHarman, Markko
dc.contributor.authorUr, Shmuelko
dc.date.accessioned2017-06-20T01:59:49Z-
dc.date.available2017-06-20T01:59:49Z-
dc.date.created2017-06-19-
dc.date.issued2009-04-01-
dc.identifier.citationIEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009, pp.101 - 110-
dc.identifier.urihttp://hdl.handle.net/10203/224168-
dc.description.abstractThis paper introduces the concept of test suite latency. The more latent a test suite, the more it is possible to repeatedly select subsets that achieve a test goal (such as coverage) without re-applying test cases. Where a test case is re-applied it cannot reveal new information. The more a test suite is forced to re-apply already applied test cases in order to achieve the test goal, the more it has become 'worn out'. Test suite latency is the flipside of wear out; the more latent a test suite, the less prone it is to wear out. The paper introduces a theory of test suite latency. It presents results from the empirical study of latency, highlighting the need for latency enhancement. The paper also introduces a strategy and algorithms for improving latency and an empirical study of their effectiveness. The results show that local search is effective at improving the latency of a test suite. © 2009 IEEE.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleMeasuring and improving latency to avoid test suite wear out-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.beginningpage101-
dc.citation.endingpage110-
dc.citation.publicationnameIEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationDenver, Colorado-
dc.identifier.doi10.1109/ICSTW.2009.10-
dc.contributor.localauthorYoo, Shin-
dc.contributor.nonIdAuthorHarman, Mark-
dc.contributor.nonIdAuthorUr, Shmuel-
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CS-Conference Papers(학술회의논문)
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