DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yoo, Shin | ko |
dc.contributor.author | Harman, Mark | ko |
dc.contributor.author | Ur, Shmuel | ko |
dc.date.accessioned | 2017-06-20T01:59:49Z | - |
dc.date.available | 2017-06-20T01:59:49Z | - |
dc.date.created | 2017-06-19 | - |
dc.date.issued | 2009-04-01 | - |
dc.identifier.citation | IEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009, pp.101 - 110 | - |
dc.identifier.uri | http://hdl.handle.net/10203/224168 | - |
dc.description.abstract | This paper introduces the concept of test suite latency. The more latent a test suite, the more it is possible to repeatedly select subsets that achieve a test goal (such as coverage) without re-applying test cases. Where a test case is re-applied it cannot reveal new information. The more a test suite is forced to re-apply already applied test cases in order to achieve the test goal, the more it has become 'worn out'. Test suite latency is the flipside of wear out; the more latent a test suite, the less prone it is to wear out. The paper introduces a theory of test suite latency. It presents results from the empirical study of latency, highlighting the need for latency enhancement. The paper also introduces a strategy and algorithms for improving latency and an empirical study of their effectiveness. The results show that local search is effective at improving the latency of a test suite. © 2009 IEEE. | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Measuring and improving latency to avoid test suite wear out | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 101 | - |
dc.citation.endingpage | 110 | - |
dc.citation.publicationname | IEEE International Conference on Software Testing, Verification, and Validation Workshops, ICSTW 2009 | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Denver, Colorado | - |
dc.identifier.doi | 10.1109/ICSTW.2009.10 | - |
dc.contributor.localauthor | Yoo, Shin | - |
dc.contributor.nonIdAuthor | Harman, Mark | - |
dc.contributor.nonIdAuthor | Ur, Shmuel | - |
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