Normalized-Full-Scale-Referencing Digital-Domain Linearity Calibration for SAR ADC

Cited 19 time in webofscience Cited 0 time in scopus
  • Hit : 624
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorChang, Dong-Jinko
dc.contributor.authorKim, Wanko
dc.contributor.authorSeo, Min-Jaeko
dc.contributor.authorHong, Hyeok-Kiko
dc.contributor.authorRyu, Seung-Takko
dc.date.accessioned2017-03-30T09:18:55Z-
dc.date.available2017-03-30T09:18:55Z-
dc.date.created2017-03-29-
dc.date.created2017-03-29-
dc.date.issued2017-02-
dc.identifier.citationIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, v.64, no.2, pp.322 - 332-
dc.identifier.issn1549-8328-
dc.identifier.urihttp://hdl.handle.net/10203/222727-
dc.description.abstractThis paper proposes a linearity calibration algorithm of a capacitive digital-to-analog converter (CDAC) for successive approximation register (SAR) analog-to-digital converters (ADCs) based on a normalized-full-scale of the DAC. Since the capacitor weight errors are represented as the difference between the real and ideal weights with respect to the normalized-full-scale, the calibrated digital representation of CDAC does not have gain error. A model of a 14-bit-format SAR ADC with a segmented CDAC by a bridge capacitor is simulated to demonstrate the performance of the proposed calibration algorithm. The effective number of bits (ENOB) and spurious-free dynamic range (SFDR) of the 14-bit-format ADC model are improved to 13.2 bits and 94.0 dB from 8.4 bits and 54.8 dB, respectively, at a standard deviation of a unit capacitor of 2%. The gain-error-free characteristic of the proposed linearity calibration algorithm is verified with a 2-channel time-interleaved (TI) SAR ADC model.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectNM CMOS-
dc.titleNormalized-Full-Scale-Referencing Digital-Domain Linearity Calibration for SAR ADC-
dc.typeArticle-
dc.identifier.wosid000395487900007-
dc.identifier.scopusid2-s2.0-85010006397-
dc.type.rimsART-
dc.citation.volume64-
dc.citation.issue2-
dc.citation.beginningpage322-
dc.citation.endingpage332-
dc.citation.publicationnameIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS-
dc.identifier.doi10.1109/TCSI.2016.2612692-
dc.contributor.localauthorRyu, Seung-Tak-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorCapacitor DAC-
dc.subject.keywordAuthorCDAC linearity calibration-
dc.subject.keywordAuthordigital calibration-
dc.subject.keywordAuthorfull-scale referring calibration-
dc.subject.keywordAuthorSAR ADC-
dc.subject.keywordAuthortime-interleaved ADC.-
dc.subject.keywordPlusNM CMOS-
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 19 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0