Analysis and modeling of resistive probes

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dc.contributor.authorKim, Sang Wan-
dc.contributor.authorHong, Daniel Seungbum-
dc.contributor.authorChoi, Woo Young-
dc.contributor.authorSong, Jae Young-
dc.contributor.authorKim, Jong Pil-
dc.contributor.authorKim, Junsoo-
dc.contributor.authorKo, Hyoungsoo-
dc.contributor.authorPark, Hongsik-
dc.contributor.authorPark, Chulmin-
dc.contributor.authorChoa, Sung-Hoon-
dc.contributor.authorLee, Jong Duk-
dc.contributor.authorShin, Hyungcheol-
dc.contributor.authorPark, Byung-Gook-
dc.date.accessioned2017-01-19T01:16:02Z-
dc.date.available2017-01-19T01:16:02Z-
dc.date.created2017-01-18-
dc.date.issued2006-10-
dc.identifier.citation2006 IEEE Nanotechnology Materials and Devices Conference-
dc.identifier.urihttp://hdl.handle.net/10203/220073-
dc.description.abstractA simple model of the resistive probe was proposed for the first time to enhance its sensitivity. The model classifies output current into three components: sensing current, unmodulated current, and punch-through current. Based on it, the electrical performance of the resistive probe was analyzed. The proposed model is expected to contribute to improvement of the sensing performance of the resistive probe.-
dc.publisherIEEE Nanotechnology Council-
dc.titleAnalysis and modeling of resistive probes-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2006 IEEE Nanotechnology Materials and Devices Conference-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationGyeongju, Korea-
dc.identifier.doi10.1109/NMDC.2006.4388746-
dc.contributor.localauthorHong, Daniel Seungbum-
dc.contributor.nonIdAuthorKim, Sang Wan-
dc.contributor.nonIdAuthorChoi, Woo Young-
dc.contributor.nonIdAuthorSong, Jae Young-
dc.contributor.nonIdAuthorKim, Jong Pil-
dc.contributor.nonIdAuthorKim, Junsoo-
dc.contributor.nonIdAuthorKo, Hyoungsoo-
dc.contributor.nonIdAuthorPark, Hongsik-
dc.contributor.nonIdAuthorPark, Chulmin-
dc.contributor.nonIdAuthorChoa, Sung-Hoon-
dc.contributor.nonIdAuthorLee, Jong Duk-
dc.contributor.nonIdAuthorShin, Hyungcheol-
dc.contributor.nonIdAuthorPark, Byung-Gook-
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MS-Conference Papers(학술회의논문)
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