Co-modeling, experimental verification, and analysis of chip-package hierarchical power distribution network

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dc.contributor.authorPark, Hyun-Jeongko
dc.contributor.authorKim, Hyung-Sooko
dc.contributor.authorPak, Jun-Soko
dc.contributor.authorYoon, Chang-Wookko
dc.contributor.authorKoo, Kyoung-Choulko
dc.contributor.authorKim, Joung-Hoko
dc.date.accessioned2011-01-26T08:53:51Z-
dc.date.available2011-01-26T08:53:51Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-04-
dc.identifier.citationIEICE TRANSACTIONS ON ELECTRONICS, v.E91C, pp.595 - 606-
dc.identifier.issn0916-8524-
dc.identifier.urihttp://hdl.handle.net/10203/21833-
dc.description.abstractIn this paper, we present and verify a new chip-package co-modeling and simulation approach for a low-noise chip-package hierarchical power distribution network (PDN) design. It is based on a hierarchical modeling to combine distributed circuit models at both chip-level PDN and package-level PDN. In particular, it includes all on- and off-chip parasitic circuit elements in the hierarchical PDN with a special consideration on on-chip decoupling capacitor design and placement inside chip. The proposed hierarchical PDN model was successfully validated with good correlations and subsequent analysis to a series of Z11 and Z21 PDN impedance measurements with a frequency range from 1 MHz to 3 GHz. Using the proposed model, we can analyze and estimate the performance of the chip-package hierarchical PDN as well as can predict the effect of high frequency electromagnetic interactions between the chip-level PDN and the package-level PDN. Furthermore, we can precisely anticipate PDN resonance frequencies, noise generation sources, and noise propagation paths through the multiple levels in the hierarchical PDN.-
dc.description.sponsorshipThis work was supported by the IT R&D program of MIC/IITA. [2005-S-118-02, Development of High Performance and Smallest SiP Technology]en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherIEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG-
dc.subjectTHROUGH-HOLE SIGNAL-
dc.subjectRADIATED EMISSIONS-
dc.subjectSWITCHING NOISE-
dc.subjectCAPACITOR-
dc.subjectDESIGN-
dc.subjectSUPPRESSION-
dc.subjectMETHODOLOGY-
dc.subjectPCBS-
dc.titleCo-modeling, experimental verification, and analysis of chip-package hierarchical power distribution network-
dc.typeArticle-
dc.identifier.wosid000255648200023-
dc.identifier.scopusid2-s2.0-77952741629-
dc.type.rimsART-
dc.citation.volumeE91C-
dc.citation.beginningpage595-
dc.citation.endingpage606-
dc.citation.publicationnameIEICE TRANSACTIONS ON ELECTRONICS-
dc.identifier.doi10.1093/ietele/e91-c.4.595-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Joung-Ho-
dc.contributor.nonIdAuthorPark, Hyun-Jeong-
dc.contributor.nonIdAuthorKim, Hyung-Soo-
dc.contributor.nonIdAuthorPak, Jun-So-
dc.contributor.nonIdAuthorYoon, Chang-Wook-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorco-modeling-
dc.subject.keywordAuthorhierarchical power distribution network (PDN)-
dc.subject.keywordAuthorchip and package-
dc.subject.keywordPlusTHROUGH-HOLE SIGNAL-
dc.subject.keywordPlusRADIATED EMISSIONS-
dc.subject.keywordPlusSWITCHING NOISE-
dc.subject.keywordPlusCAPACITOR-
dc.subject.keywordPlusDESIGN-
dc.subject.keywordPlusSUPPRESSION-
dc.subject.keywordPlusMETHODOLOGY-
dc.subject.keywordPlusPCBS-
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