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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy

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dc.contributor.authorYuk, Jong Min-
dc.contributor.authorJeong, Hu Young-
dc.contributor.authorKim, Na Yeon-
dc.contributor.authorLee, Mi Jin-
dc.contributor.authorLee, Jeong Yong-
dc.contributor.authorLee, Zonghoon-
dc.date.accessioned2017-01-11T12:57:35Z-
dc.date.available2017-01-11T12:57:35Z-
dc.date.created2016-12-26-
dc.date.issued2013-08-04-
dc.identifier.citationMicroscopy & Microanalysis 2013 Meeting-
dc.identifier.urihttp://hdl.handle.net/10203/217504-
dc.languageEnglish-
dc.publisherMicroscopy & Microanalysis-
dc.titleDirect Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameMicroscopy & Microanalysis 2013 Meeting-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationIndiana Convention Center, IN-
dc.contributor.localauthorYuk, Jong Min-
dc.contributor.localauthorJeong, Hu Young-
dc.contributor.localauthorLee, Jeong Yong-
dc.contributor.nonIdAuthorKim, Na Yeon-
dc.contributor.nonIdAuthorLee, Mi Jin-
dc.contributor.nonIdAuthorLee, Zonghoon-
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MS-Conference Papers(학술회의논문)
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