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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Conference Papers(학술회의논문)

Microstructural Characterization in Rotated Double-Layer Graphene Using Transmission Electron Microscopy

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dc.contributor.authorLee, JeongYong-
dc.contributor.authorYuk, Jong Min-
dc.contributor.authorJeong, HY-
dc.contributor.authorLee, MJ-
dc.contributor.authorKim, NY-
dc.contributor.authorLee, ZH-
dc.date.accessioned2017-01-11T11:53:19Z-
dc.date.available2017-01-11T11:53:19Z-
dc.date.created2014-01-09-
dc.date.issued2013-04-03-
dc.identifier.citation2013 Materials Research Society Spring Meeting-
dc.identifier.urihttp://hdl.handle.net/10203/217258-
dc.languageEnglish-
dc.publisherMaterials Research Society-
dc.titleMicrostructural Characterization in Rotated Double-Layer Graphene Using Transmission Electron Microscopy-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2013 Materials Research Society Spring Meeting-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Francisco, CA-
dc.contributor.localauthorLee, JeongYong-
dc.contributor.localauthorYuk, Jong Min-
dc.contributor.nonIdAuthorJeong, HY-
dc.contributor.nonIdAuthorLee, MJ-
dc.contributor.nonIdAuthorKim, NY-
dc.contributor.nonIdAuthorLee, ZH-
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MS-Conference Papers(학술회의논문)
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