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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

In-depth characterization of silicon nanowire field-effect transistor (SiNW-FET) for neural recording and direct performance comparison with passive MEA

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dc.contributor.authorKang, Hongkiko
dc.contributor.authorKim, Jee Yeonko
dc.contributor.authorChoi, Yang Kyuko
dc.contributor.authorNam, Yoonkeyko
dc.date.accessioned2017-01-11T11:35:01Z-
dc.date.available2017-01-11T11:35:01Z-
dc.date.created2016-12-22-
dc.date.created2016-12-22-
dc.date.created2016-12-22-
dc.date.issued2016-06-29-
dc.identifier.citation10th Int. Meeting on Substrate-Integrated Microelectrode Arrays, 2016-
dc.identifier.urihttp://hdl.handle.net/10203/217138-
dc.languageEnglish-
dc.publisherNatural and Medical Sciences Institute at the University of Tuebingen-
dc.titleIn-depth characterization of silicon nanowire field-effect transistor (SiNW-FET) for neural recording and direct performance comparison with passive MEA-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname10th Int. Meeting on Substrate-Integrated Microelectrode Arrays, 2016-
dc.identifier.conferencecountryGE-
dc.identifier.conferencelocationReutlingen-
dc.contributor.localauthorChoi, Yang Kyu-
dc.contributor.localauthorNam, Yoonkey-
dc.contributor.nonIdAuthorKang, Hongki-
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EE-Conference Papers(학술회의논문)BiS-Conference Papers(학술회의논문)
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