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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Probe Card Design with Signal and Power Integrity for Wafer-level Application Processor Test in LPDDR Channel

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dc.contributor.authorKim, Jounghoko
dc.contributor.authorSong, Jinwookko
dc.contributor.authorLee, Eunjungko
dc.contributor.authorKim, Jonghoonko
dc.contributor.authorPark, Shinyoungko
dc.contributor.authorPark, Jeoung Keunko
dc.contributor.authorPark, Jong Hyunko
dc.contributor.authorYoon, Hee Bangko
dc.contributor.authorKim, Ilko
dc.contributor.authorNam, Seungkiko
dc.date.accessioned2017-01-03T08:57:48Z-
dc.date.available2017-01-03T08:57:48Z-
dc.date.created2016-11-21-
dc.date.created2016-11-21-
dc.date.created2016-11-21-
dc.date.issued2016-05-31-
dc.identifier.citation66th Electronic Components and Technology Conference (ECTC)-
dc.identifier.urihttp://hdl.handle.net/10203/215897-
dc.languageEnglish-
dc.publisher66th Electronic Components and Technology Conference (ECTC)-
dc.titleProbe Card Design with Signal and Power Integrity for Wafer-level Application Processor Test in LPDDR Channel-
dc.typeConference-
dc.identifier.wosid000386103500365-
dc.identifier.scopusid2-s2.0-84987814987-
dc.type.rimsCONF-
dc.citation.publicationname66th Electronic Components and Technology Conference (ECTC)-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationCosmopolitan Hotel of Las Vegas-
dc.contributor.localauthorKim, Joungho-
dc.contributor.nonIdAuthorSong, Jinwook-
dc.contributor.nonIdAuthorLee, Eunjung-
dc.contributor.nonIdAuthorKim, Jonghoon-
dc.contributor.nonIdAuthorPark, Shinyoung-
dc.contributor.nonIdAuthorPark, Jeoung Keun-
dc.contributor.nonIdAuthorPark, Jong Hyun-
dc.contributor.nonIdAuthorYoon, Hee Bang-
dc.contributor.nonIdAuthorKim, Il-
dc.contributor.nonIdAuthorNam, Seungki-
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EE-Conference Papers(학술회의논문)
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