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College of Engineering(공과대학)Dept. of Materials Science and Engineering(신소재공학과)MS-Journal Papers(저널논문)

Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy

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dc.contributor.authorYuk, Jong Minko
dc.contributor.authorJeong, Huyoungko
dc.contributor.authorKim, Nayeonko
dc.contributor.authorLee, Mijinko
dc.contributor.authorLee, Jeong Yongko
dc.contributor.authorlee, Zonghoonko
dc.date.accessioned2016-12-14T02:27:00Z-
dc.date.available2016-12-14T02:27:00Z-
dc.date.created2016-06-16-
dc.date.created2016-06-16-
dc.date.created2016-06-16-
dc.date.issued2013-08-
dc.identifier.citationMICROSCOPY AND MICROANALYSIS, v.19, no.S2, pp.1226 - 1227-
dc.identifier.issn1431-9276-
dc.identifier.urihttp://hdl.handle.net/10203/214857-
dc.languageEnglish-
dc.publisherCAMBRIDGE UNIV PRESS-
dc.titleDirect Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy-
dc.typeArticle-
dc.type.rimsART-
dc.citation.volume19-
dc.citation.issueS2-
dc.citation.beginningpage1226-
dc.citation.endingpage1227-
dc.citation.publicationnameMICROSCOPY AND MICROANALYSIS-
dc.identifier.doi10.1017/S143192761300812X-
dc.contributor.localauthorYuk, Jong Min-
dc.contributor.localauthorLee, Jeong Yong-
dc.contributor.nonIdAuthorJeong, Huyoung-
dc.contributor.nonIdAuthorKim, Nayeon-
dc.contributor.nonIdAuthorLee, Mijin-
dc.contributor.nonIdAuthorlee, Zonghoon-
dc.description.isOpenAccessN-
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MS-Journal Papers(저널논문)
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