Distribution of critical current density for magnetic domain wall motion
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Fukami, S. | ko |
| dc.contributor.author | Yamanouchi, M. | ko |
| dc.contributor.author | Nakatani, Y. | ko |
| dc.contributor.author | Kim, Kab-Jin | ko |
| dc.contributor.author | Koyama, T. | ko |
| dc.contributor.author | Chiba, D. | ko |
| dc.contributor.author | Ikeda, S. | ko |
| dc.contributor.author | Kasai, N. | ko |
| dc.contributor.author | Ono, T. | ko |
| dc.contributor.author | Ohno, H. | ko |
| dc.date.accessioned | 2016-11-30T01:38:49Z | - |
| dc.date.available | 2016-11-30T01:38:49Z | - |
| dc.date.created | 2016-11-07 | - |
| dc.date.created | 2016-11-07 | - |
| dc.date.created | 2016-11-07 | - |
| dc.date.created | 2016-11-07 | - |
| dc.date.issued | 2014-05 | - |
| dc.identifier.citation | JOURNAL OF APPLIED PHYSICS, v.115, no.17 | - |
| dc.identifier.issn | 0021-8979 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/214166 | - |
| dc.description.abstract | The bit-to-bit distribution of a critical current density for magnetic domain wall (DW) motion is studied using Co/Ni wires with various wire widths (ws). The distribution inherently decreases with the w, and the ratio of standard deviation to average is 9.8% for wires with w = 40 nm. It is found that a self-distribution within one device, which is evaluated through repeated measurement, is a dominant factor in the bit-to-bit distribution. Micromagnetic simulation reveals that the distribution originates from DW configuration, which varies with device size. (C) 2014 AIP Publishing LLC. | - |
| dc.language | English | - |
| dc.publisher | AMER INST PHYSICS | - |
| dc.title | Distribution of critical current density for magnetic domain wall motion | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000335643700428 | - |
| dc.identifier.scopusid | 2-s2.0-84903879116 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 115 | - |
| dc.citation.issue | 17 | - |
| dc.citation.publicationname | JOURNAL OF APPLIED PHYSICS | - |
| dc.identifier.doi | 10.1063/1.4866394 | - |
| dc.contributor.localauthor | Kim, Kab-Jin | - |
| dc.contributor.nonIdAuthor | Fukami, S. | - |
| dc.contributor.nonIdAuthor | Yamanouchi, M. | - |
| dc.contributor.nonIdAuthor | Nakatani, Y. | - |
| dc.contributor.nonIdAuthor | Koyama, T. | - |
| dc.contributor.nonIdAuthor | Chiba, D. | - |
| dc.contributor.nonIdAuthor | Ikeda, S. | - |
| dc.contributor.nonIdAuthor | Kasai, N. | - |
| dc.contributor.nonIdAuthor | Ono, T. | - |
| dc.contributor.nonIdAuthor | Ohno, H. | - |
| dc.description.isOpenAccess | N | - |
| dc.type.journalArticle | Article; Proceedings Paper | - |
| dc.subject.keywordPlus | VARIABILITY | - |
| dc.subject.keywordPlus | MEMORY | - |
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