DC Field | Value | Language |
---|---|---|
dc.contributor.author | Han, Woo Hyun | ko |
dc.contributor.author | Oh, Young Jun | ko |
dc.contributor.author | Chang, Kee Joo | ko |
dc.date.accessioned | 2016-07-13T01:59:48Z | - |
dc.date.available | 2016-07-13T01:59:48Z | - |
dc.date.created | 2015-12-29 | - |
dc.date.issued | 2015-07 | - |
dc.identifier.citation | 2015 28th International Conference on Defects in Semiconductors | - |
dc.identifier.uri | http://hdl.handle.net/10203/210810 | - |
dc.language | English | - |
dc.publisher | ICDS | - |
dc.title | Electronic structure of oxygen interstitial defects in amorphous In-Ga-Zn-O semiconductor | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2015 28th International Conference on Defects in Semiconductors | - |
dc.identifier.conferencecountry | FI | - |
dc.identifier.conferencelocation | Aalto University Otaniemi campus | - |
dc.contributor.localauthor | Chang, Kee Joo | - |
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