DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song, Yong-Ha | ko |
dc.contributor.author | Kim, Min-Wu | ko |
dc.contributor.author | Lee, Jeong Oen | ko |
dc.contributor.author | Ko, Seung-Deok | ko |
dc.contributor.author | Yoon, Jun-Bo | ko |
dc.date.accessioned | 2016-07-05T08:24:53Z | - |
dc.date.available | 2016-07-05T08:24:53Z | - |
dc.date.created | 2013-10-05 | - |
dc.date.created | 2013-10-05 | - |
dc.date.issued | 2013-08 | - |
dc.identifier.citation | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, v.22, no.4, pp.846 - 854 | - |
dc.identifier.issn | 1057-7157 | - |
dc.identifier.uri | http://hdl.handle.net/10203/209384 | - |
dc.description.abstract | This paper reports a dual-contact microelectromechanical switch, which consists of two contacts in a single switch: one with a soft contact material and the other with a hard contact material to achieve low contact resistance and high reliability at the same time under hot switching conditions. In a single switching operation, the proposed dual-contact switch makes contact twice in sequence, where the first contact is made with a hard contact material (Pt-to-Pt) that can withstand an abrupt hot switching condition (high electric field or micro-arcing). The second contact is then accomplished with the soft contact material (Au-to-Au) that has low-contact resistance, through which most of the current flows. In contrast, when the switch releases contact, the Au-to-Au contact is initially detached, and this is followed by the release of the Pt-to-Pt contact. In this way, the dual-contact switch showed longer lifetime than that of a single Au-to-Au contact-only switch by up to fortyfold, and even better lifetime than that of a single Pt-to-Pt contact-only switch by more than two times in open laboratory environments (unpackaged). At the same time, contact resistance of the dual-contact switch was under 0.3 Omega at 50 V of the gate voltage, which is more than seven times smaller than that of the single Pt-to-Pt contact-only switch (2.2 Omega), due to the Au-to-Au contact sub-switch (the contact resistance of the single Au-to-Au contact-only switch was 0.36 Omega). [2012-0265] | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | MEMS RF SWITCH | - |
dc.subject | POWER APPLICATIONS | - |
dc.subject | LIFETIME | - |
dc.subject | RELAYS | - |
dc.subject | DESIGN | - |
dc.subject | FORCE | - |
dc.title | Complementary Dual-Contact Switch Using Soft and Hard Contact Materials for Achieving Low Contact Resistance and High Reliability Simultaneously | - |
dc.type | Article | - |
dc.identifier.wosid | 000325408100004 | - |
dc.identifier.scopusid | 2-s2.0-84881475948 | - |
dc.type.rims | ART | - |
dc.citation.volume | 22 | - |
dc.citation.issue | 4 | - |
dc.citation.beginningpage | 846 | - |
dc.citation.endingpage | 854 | - |
dc.citation.publicationname | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS | - |
dc.identifier.doi | 10.1109/JMEMS.2013.2248125 | - |
dc.contributor.localauthor | Yoon, Jun-Bo | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Contact material | - |
dc.subject.keywordAuthor | contact resistance | - |
dc.subject.keywordAuthor | microelectromechanical systems (MEMS) relay | - |
dc.subject.keywordAuthor | MEMS switch | - |
dc.subject.keywordAuthor | microswitch | - |
dc.subject.keywordAuthor | reliability | - |
dc.subject.keywordPlus | MEMS RF SWITCH | - |
dc.subject.keywordPlus | POWER APPLICATIONS | - |
dc.subject.keywordPlus | LIFETIME | - |
dc.subject.keywordPlus | RELAYS | - |
dc.subject.keywordPlus | DESIGN | - |
dc.subject.keywordPlus | FORCE | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.