Nondestructive evaluation of multilayered paint films in ambient atmosphere using terahertz reflection spectroscopy

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dc.contributor.authorChoi, Jindooko
dc.contributor.authorKwon, Won Sikko
dc.contributor.authorKim, Kyung-Sooko
dc.contributor.authorKim, Soohyunko
dc.date.accessioned2016-07-04T08:06:29Z-
dc.date.available2016-07-04T08:06:29Z-
dc.date.created2016-05-23-
dc.date.created2016-05-23-
dc.date.issued2016-06-
dc.identifier.citationNDT & E INTERNATIONAL, v.80, pp.71 - 76-
dc.identifier.issn0963-8695-
dc.identifier.urihttp://hdl.handle.net/10203/209163-
dc.description.abstractThe reliability of material characterization with terahertz (THz) waves is typically compromised by irrelevant signals present in the THz measurements. These are well observed in the investigation of layered materials in humid environments, causing difficulty in accurate analyses. In this article, we suggest a realistically employable method of analyzing angled THz reflection measurements in ambient atmosphere for qualitative monitoring and evaluation of multilayered paint films. In particular, we present successive decomposition of THz sample signals for individual identification of each constituent layer in the samples. It is shown that the extracted spectrum of each paint layer presents sufficient information for effective monitoring of the multilayered structures. In this process, THz spectra of the marine paints EH2350, Interthane 989, BEA777, and ENA300 are reported for the first time. Our experimental findings show promise in highly effective nondestructive inspection of layered structures for real-world evaluation applications. (C) 2016 Published by Elsevier Ltd-
dc.languageEnglish-
dc.publisherELSEVIER SCI LTD-
dc.subjectTIME-DOMAIN SPECTROSCOPY-
dc.subjectTHICKNESS-
dc.titleNondestructive evaluation of multilayered paint films in ambient atmosphere using terahertz reflection spectroscopy-
dc.typeArticle-
dc.identifier.wosid000374362000009-
dc.identifier.scopusid2-s2.0-84959486159-
dc.type.rimsART-
dc.citation.volume80-
dc.citation.beginningpage71-
dc.citation.endingpage76-
dc.citation.publicationnameNDT & E INTERNATIONAL-
dc.identifier.doi10.1016/j.ndteint.2016.02.011-
dc.contributor.localauthorKim, Kyung-Soo-
dc.contributor.localauthorKim, Soohyun-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorMultilayered films-
dc.subject.keywordAuthorNondestructive material evaluation-
dc.subject.keywordAuthorTerahertz reflection spectroscopy-
dc.subject.keywordAuthorTerahertz signal decomposition-
dc.subject.keywordPlusTIME-DOMAIN SPECTROSCOPY-
dc.subject.keywordPlusTHICKNESS-
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