DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hong, Shin | ko |
dc.contributor.author | Staats, Matthew | ko |
dc.contributor.author | Ahn, Jaemin | ko |
dc.contributor.author | Kim, Moonzoo | ko |
dc.contributor.author | Rothermel, Gregg | ko |
dc.date.accessioned | 2016-05-12T03:48:03Z | - |
dc.date.available | 2016-05-12T03:48:03Z | - |
dc.date.created | 2016-01-06 | - |
dc.date.created | 2016-01-06 | - |
dc.date.created | 2016-01-06 | - |
dc.date.issued | 2013-03-20 | - |
dc.identifier.citation | International Conference on Software Testing, Verification and Validation (ICST) | - |
dc.identifier.uri | http://hdl.handle.net/10203/207290 | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | The Impact of Concurrent Coverage Metrics on Testing Effectiveness | - |
dc.type | Conference | - |
dc.identifier.wosid | 000332473300026 | - |
dc.identifier.scopusid | 2-s2.0-84883325430 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | International Conference on Software Testing, Verification and Validation (ICST) | - |
dc.identifier.conferencecountry | LU | - |
dc.identifier.conferencelocation | Neumunster Abbey, Luxembourg | - |
dc.contributor.localauthor | Kim, Moonzoo | - |
dc.contributor.nonIdAuthor | Staats, Matthew | - |
dc.contributor.nonIdAuthor | Ahn, Jaemin | - |
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