DC Field | Value | Language |
---|---|---|
dc.contributor.author | Moon, Seokhyun | - |
dc.contributor.author | Kim, Yoonho | - |
dc.contributor.author | Kim, Moonzoo | - |
dc.contributor.author | Yoo, Shin | - |
dc.date.accessioned | 2016-05-12T03:47:36Z | - |
dc.date.available | 2016-05-12T03:47:36Z | - |
dc.date.created | 2016-01-06 | - |
dc.date.issued | 2014-04-02 | - |
dc.identifier.citation | International Conference on Software Testing, Verification and Validation (ICST), pp.153 - 162 | - |
dc.identifier.uri | http://hdl.handle.net/10203/207287 | - |
dc.description.abstract | We present MUSE (MUtation-baSEd fault localization technique), a new fault localization technique based on mutation analysis. A key idea of MUSE is to identify a faulty statement by utilizing different characteristics of two groups of mutants-one that mutates a faulty statement and the other that mutates a correct statement. We also propose a new evaluation metric for fault localization techniques based on information theory, called Locality Information Loss (LIL): it can measure the aptitude of a localization technique for automated fault repair systems as well as human debuggers. The empirical evaluation using 14 faulty versions of the five real-world programs shows that MUSE localizes a fault after reviewing 7.4 statements on average, which is about 25 times more precise than the state-of-the-art SBFL technique Op2 | - |
dc.language | English | - |
dc.publisher | IEEE Computer Society | - |
dc.title | Ask the Mutants: Mutation Faulty Programs for Fault Localization | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 153 | - |
dc.citation.endingpage | 162 | - |
dc.citation.publicationname | International Conference on Software Testing, Verification and Validation (ICST) | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | Cleveland, USA | - |
dc.contributor.localauthor | Kim, Yoonho | - |
dc.contributor.localauthor | Kim, Moonzoo | - |
dc.contributor.nonIdAuthor | Moon, Seokhyun | - |
dc.contributor.nonIdAuthor | Yoo, Shin | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.