DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shim, Hyun Bin | ko |
dc.contributor.author | Kang, In-Ku | ko |
dc.contributor.author | Jeon, Gwang-Jae | ko |
dc.contributor.author | Kim, Woo Young | ko |
dc.contributor.author | Lee, Hee Chul | ko |
dc.date.accessioned | 2016-04-20T06:27:08Z | - |
dc.date.available | 2016-04-20T06:27:08Z | - |
dc.date.created | 2015-10-29 | - |
dc.date.created | 2015-10-29 | - |
dc.date.issued | 2015-09 | - |
dc.identifier.citation | INFRARED PHYSICS & TECHNOLOGY, v.72, pp.135 - 139 | - |
dc.identifier.issn | 1350-4495 | - |
dc.identifier.uri | http://hdl.handle.net/10203/205347 | - |
dc.description.abstract | In this paper, we will focus on an IR transmittance enhancement technique from the window material point of view by using metal oxides, especially nickel oxide (NiO). At first, anti-reflection (AR) coatings were modeled by using the optical properties of NiO films. The transmittance of the model was predicted using Swanepoel's model and verified with NiO film prepared by rf magnetron sputtering. Also, post-deposition annealing was performed and was found to change the optical properties of the NiO film. Therefore, we analyzed the annealing effect on the IR optical properties of the NiO film. Furthermore, we confirmed the durability of the NiO film and verified the possibility of this material being used in infrared optics. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | THIN-FILMS | - |
dc.subject | MECHANICAL-PROPERTIES | - |
dc.subject | CARBON-FILMS | - |
dc.subject | SILICON | - |
dc.subject | ABSORPTION | - |
dc.subject | CONSTANTS | - |
dc.subject | COATINGS | - |
dc.title | Controlling the infrared optical properties of rf-sputtered NiO films for applications of infrared window | - |
dc.type | Article | - |
dc.identifier.wosid | 000362146700018 | - |
dc.identifier.scopusid | 2-s2.0-84938821849 | - |
dc.type.rims | ART | - |
dc.citation.volume | 72 | - |
dc.citation.beginningpage | 135 | - |
dc.citation.endingpage | 139 | - |
dc.citation.publicationname | INFRARED PHYSICS & TECHNOLOGY | - |
dc.identifier.doi | 10.1016/j.infrared.2015.07.023 | - |
dc.contributor.localauthor | Lee, Hee Chul | - |
dc.contributor.nonIdAuthor | Kang, In-Ku | - |
dc.contributor.nonIdAuthor | Kim, Woo Young | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Nickel oxide | - |
dc.subject.keywordAuthor | Infrared window | - |
dc.subject.keywordAuthor | Anti-reflection coating | - |
dc.subject.keywordAuthor | Annealing | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | MECHANICAL-PROPERTIES | - |
dc.subject.keywordPlus | CARBON-FILMS | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordPlus | ABSORPTION | - |
dc.subject.keywordPlus | CONSTANTS | - |
dc.subject.keywordPlus | COATINGS | - |
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