Effect of the Thermal Conductivity on Resistive Switching in GeTe and Ge2Sb2Te5 Nanowires

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dc.contributor.authorPark, Sungjinko
dc.contributor.authorPark, Dambiko
dc.contributor.authorJeong, Kwangsikko
dc.contributor.authorKirn, Taeokko
dc.contributor.authorPark, SeungJongko
dc.contributor.authorAhn, Minko
dc.contributor.authorYang, Won Junko
dc.contributor.authorHan, Jeong Hwako
dc.contributor.authorJeong, Hong Sikko
dc.contributor.authorJeon, Seong Giko
dc.contributor.authorSong, Jae Yongko
dc.contributor.authorCho, Mann-Hoko
dc.date.accessioned2016-04-20T06:19:30Z-
dc.date.available2016-04-20T06:19:30Z-
dc.date.created2015-11-02-
dc.date.created2015-11-02-
dc.date.issued2015-10-
dc.identifier.citationACS APPLIED MATERIALS & INTERFACES, v.7, no.39, pp.21819 - 21827-
dc.identifier.issn1944-8244-
dc.identifier.urihttp://hdl.handle.net/10203/205258-
dc.description.abstractThe thermal conduction characteristics of GeTe and Ge2Sb2Te5(GST) nanowires were investigated using an optical method to determine the local temperature by Raman spectroscopy. Since the localization of surface charge in a single-crystalline nanostructure can enhance charge-phonon scattering, the thermal conductivity value (kappa) of single crystalline GeTe and GST nanowires was decreased significantly to 1.44 Wm(-1) K-1 for GeTe and 1.13 Wm(-1) K-1 for GST, compared to reported values for polycrystalline structures. The SET-to-RESET state in single-crystalline GeTe and GST nanowires are characteristic of a memory device. Unlike previous reports using GeTe and GST nanowires, the SET-to-RESET characteristics showed a bipolar switching shape and no unipolar switching. In addition, after multiple cycles of operation, a significant change in morphology and composition was observed without any structural phase transition, indicating that atoms migrate toward the cathode or anode, depending on their electronegativities. This change caused by a field effect indicates that the structural phase transition does not occur in the case of GeTe and GST nanowires with a significantly lowered thermal conductivity and stable crystalline structure. Finally, the formation of voids and hillocks as the result of the electromigration critically degrades device reliability.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.subjectGERMANIUM TELLURIDE NANOWIRE-
dc.subjectPHASE-CHANGE MEMORY-
dc.subjectSILICON NANOWIRES-
dc.subjectLAYER GRAPHENE-
dc.subjectAMORPHIZATION-
dc.subjectFILMS-
dc.subjectELECTROMIGRATION-
dc.titleEffect of the Thermal Conductivity on Resistive Switching in GeTe and Ge2Sb2Te5 Nanowires-
dc.typeArticle-
dc.identifier.wosid000362628900026-
dc.identifier.scopusid2-s2.0-84944096209-
dc.type.rimsART-
dc.citation.volume7-
dc.citation.issue39-
dc.citation.beginningpage21819-
dc.citation.endingpage21827-
dc.citation.publicationnameACS APPLIED MATERIALS & INTERFACES-
dc.identifier.doi10.1021/acsami.5b05703-
dc.contributor.nonIdAuthorPark, Sungjin-
dc.contributor.nonIdAuthorPark, Dambi-
dc.contributor.nonIdAuthorJeong, Kwangsik-
dc.contributor.nonIdAuthorKirn, Taeok-
dc.contributor.nonIdAuthorPark, SeungJong-
dc.contributor.nonIdAuthorAhn, Min-
dc.contributor.nonIdAuthorYang, Won Jun-
dc.contributor.nonIdAuthorHan, Jeong Hwa-
dc.contributor.nonIdAuthorJeong, Hong Sik-
dc.contributor.nonIdAuthorSong, Jae Yong-
dc.contributor.nonIdAuthorCho, Mann-Ho-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorGe2Sb2Te5-
dc.subject.keywordAuthorGeTe-
dc.subject.keywordAuthorphase-change memory-
dc.subject.keywordAuthorthermal conductivity-
dc.subject.keywordAuthorbipolar switching property-
dc.subject.keywordPlusGERMANIUM TELLURIDE NANOWIRE-
dc.subject.keywordPlusPHASE-CHANGE MEMORY-
dc.subject.keywordPlusSILICON NANOWIRES-
dc.subject.keywordPlusLAYER GRAPHENE-
dc.subject.keywordPlusAMORPHIZATION-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusELECTROMIGRATION-
dc.subject.keywordPlusTEMPERATURE-
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