DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang, Sung Won | ko |
dc.contributor.author | Baek, Hae Un | ko |
dc.contributor.author | Kim, Jung Min | ko |
dc.contributor.author | Lee, Ji Hyun | ko |
dc.date.accessioned | 2016-04-18T05:10:24Z | - |
dc.date.available | 2016-04-18T05:10:24Z | - |
dc.date.created | 2015-11-24 | - |
dc.date.created | 2015-11-24 | - |
dc.date.created | 2015-11-24 | - |
dc.date.created | 2015-11-24 | - |
dc.date.issued | 2015-07-01 | - |
dc.identifier.citation | 2015 IEEE 39th Annual Computer Software and Applications Conference (COMPSAC), pp.433 - 440 | - |
dc.identifier.uri | http://hdl.handle.net/10203/204448 | - |
dc.description.abstract | This paper proposes a systematic software product line test case derivation method that reuses test data. With the method, significant test cases reduction can be achieved over the conventional software product line testing. The key to achieving reuse lies in performing test data determination during domain test engineering so that application test engineers share test data rather than creating different test data for different products. A case study shows the effect of significantly reducing the number of derived test cases without sacrificing error detection capability. | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Systematic Software Product Line Test Case Derivation for Test Data Reuse | - |
dc.type | Conference | - |
dc.identifier.wosid | 000381598900073 | - |
dc.identifier.scopusid | 2-s2.0-84962052799 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 433 | - |
dc.citation.endingpage | 440 | - |
dc.citation.publicationname | 2015 IEEE 39th Annual Computer Software and Applications Conference (COMPSAC) | - |
dc.identifier.conferencecountry | CH | - |
dc.identifier.conferencelocation | Tunghai University | - |
dc.identifier.doi | 10.1109/COMPSAC.2015.174 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Kang, Sung Won | - |
dc.contributor.nonIdAuthor | Baek, Hae Un | - |
dc.contributor.nonIdAuthor | Kim, Jung Min | - |
dc.contributor.nonIdAuthor | Lee, Ji Hyun | - |
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