Experimental study on Quantum Mechanical Effect for Insensitivity of Threshold Voltage against Temperature Variation in Strained SOI MOSFETs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jeon, Chang Hoon | ko |
| dc.contributor.author | Lee, Byung Hyun | ko |
| dc.contributor.author | Jang, Byung Chul | ko |
| dc.contributor.author | Choi, Sung Yool | ko |
| dc.contributor.author | Choi, Yang Kyu | ko |
| dc.date.accessioned | 2016-04-18T04:57:51Z | - |
| dc.date.available | 2016-04-18T04:57:51Z | - |
| dc.date.created | 2015-11-21 | - |
| dc.date.created | 2015-11-21 | - |
| dc.date.created | 2015-11-21 | - |
| dc.date.created | 2015-11-21 | - |
| dc.date.issued | 2015-10-08 | - |
| dc.identifier.citation | IEEE SOI-3D-Subthreshold Microelectronics Unified Conference(S3S) | - |
| dc.identifier.uri | http://hdl.handle.net/10203/204313 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Experimental study on Quantum Mechanical Effect for Insensitivity of Threshold Voltage against Temperature Variation in Strained SOI MOSFETs | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000370657300068 | - |
| dc.identifier.scopusid | 2-s2.0-84961778451 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE SOI-3D-Subthreshold Microelectronics Unified Conference(S3S) | - |
| dc.identifier.conferencecountry | US | - |
| dc.identifier.conferencelocation | Rohnert Park, CA | - |
| dc.contributor.localauthor | Choi, Sung Yool | - |
| dc.contributor.localauthor | Choi, Yang Kyu | - |
| dc.contributor.nonIdAuthor | Jeon, Chang Hoon | - |
| dc.contributor.nonIdAuthor | Lee, Byung Hyun | - |
| dc.contributor.nonIdAuthor | Jang, Byung Chul | - |
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