Influence of Deposition Temperature on TiO2-x Films for Infrared Image Sensor Applications TiO2-x Films: Infrared Image Sensor Applications
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Reddy, Y Ashok Kumar | ko |
| dc.contributor.author | Lee, Hee Chul | ko |
| dc.contributor.author | Shin, Young Bong | ko |
| dc.contributor.author | Kang, In Ku | ko |
| dc.date.accessioned | 2016-04-18T04:49:43Z | - |
| dc.date.available | 2016-04-18T04:49:43Z | - |
| dc.date.created | 2015-11-24 | - |
| dc.date.created | 2015-11-24 | - |
| dc.date.created | 2015-11-24 | - |
| dc.date.issued | 2015-11-03 | - |
| dc.identifier.citation | IEEE Sensors 2015 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/204225 | - |
| dc.language | English | - |
| dc.publisher | IEEE | - |
| dc.title | Influence of Deposition Temperature on TiO2-x Films for Infrared Image Sensor Applications TiO2-x Films: Infrared Image Sensor Applications | - |
| dc.type | Conference | - |
| dc.identifier.wosid | 000380440800304 | - |
| dc.identifier.scopusid | 2-s2.0-84963591023 | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE Sensors 2015 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | BEXCO, Busan | - |
| dc.contributor.localauthor | Lee, Hee Chul | - |
| dc.contributor.nonIdAuthor | Reddy, Y Ashok Kumar | - |
| dc.contributor.nonIdAuthor | Shin, Young Bong | - |
| dc.contributor.nonIdAuthor | Kang, In Ku | - |
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