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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Signal Integrity Design of High-speed Semiconductor Test Probe Card

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dc.contributor.authorKim, Jong Hoonko
dc.contributor.authorSong, Jin Wookko
dc.contributor.authorLee, Eun Jungko
dc.contributor.authorLee, Man Hoko
dc.contributor.authorPark, Jung Keunko
dc.contributor.authorLee, Ji Sunko
dc.contributor.authorKim, Hyun Minko
dc.contributor.authorKim, Young Buko
dc.contributor.authorNam, Seung Kiko
dc.contributor.authorKim, Joung Hoko
dc.date.accessioned2016-04-18T04:43:41Z-
dc.date.available2016-04-18T04:43:41Z-
dc.date.created2015-11-23-
dc.date.issued2015-11-23-
dc.identifier.citation8th 2015 Korea-Japan Joint Conference on EMT/EMC/BE (KJJC)-
dc.identifier.urihttp://hdl.handle.net/10203/204160-
dc.languageEnglish-
dc.publisher8th 2015 Korea-Japan Joint Conference on EMT/EMC/BE (KJJC)-
dc.titleSignal Integrity Design of High-speed Semiconductor Test Probe Card-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname8th 2015 Korea-Japan Joint Conference on EMT/EMC/BE (KJJC)-
dc.identifier.conferencecountryJA-
dc.identifier.conferencelocationSendai International Center-
dc.contributor.localauthorKim, Joung Ho-
dc.contributor.nonIdAuthorPark, Jung Keun-
dc.contributor.nonIdAuthorLee, Ji Sun-
dc.contributor.nonIdAuthorKim, Hyun Min-
dc.contributor.nonIdAuthorKim, Young Bu-
dc.contributor.nonIdAuthorNam, Seung Ki-
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EE-Conference Papers(학술회의논문)
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