DC Field | Value | Language |
---|---|---|
dc.contributor.author | Reddy, Y. Ashok Kumar | ko |
dc.contributor.author | Kang, In-Ku | ko |
dc.contributor.author | Shin, Young Bong | ko |
dc.contributor.author | Lee, Hee Chul | ko |
dc.date.accessioned | 2016-04-15T03:02:29Z | - |
dc.date.available | 2016-04-15T03:02:29Z | - |
dc.date.created | 2015-09-07 | - |
dc.date.created | 2015-09-07 | - |
dc.date.issued | 2015-09 | - |
dc.identifier.citation | JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.48, no.35 | - |
dc.identifier.issn | 0022-3727 | - |
dc.identifier.uri | http://hdl.handle.net/10203/203915 | - |
dc.description.abstract | A heat-sensitive layer (TiO2-x) was successfully deposited by RF reactive magnetron sputtering for infrared (IR) image sensors at different relative mass flow of oxygen gas (R-O2) levels. The deposition rate was decreased with an increase in the percentage of R-O2 from 3.4% to 3.7%. TiO2-x samples deposited at room temperature exhibited amorphous characteristics. Oxygen deficiency causes a change in the oxidation state and is assumed to decrease the Ti4+ component on the surfaces of TiO2-x films. The oxygen stoichiometry (x) in TiO2-x films decreased from 0.35 to 0.05 with increasing the RO2 level from 3.4% to 3.7%, respectively. In TiO2-x-test-patterned samples, the resistivity decreased with the temperature, confirming the typical semiconducting property. The bolometric properties of the resistivity, temperature coefficient of resistance (TCR), and the flicker (1/f) noise parameter were determined at different x values in TiO2-x samples. The rate of TCR dependency with regard to the 1/f noise parameter is a universal bolometric parameter (beta), acting as the dynamic element in a bolometer. It is high when a sample has a relatively low resistivity (0.82 Omega.cm) and a lower 1/f noise parameter (3.16 x 10(-12)). The results of this study indicate that reactively sputtered TiO2-x is a viable bolometric material for uncooled IR image sensor devices. | - |
dc.language | English | - |
dc.publisher | IOP PUBLISHING LTD | - |
dc.subject | THIN-FILMS | - |
dc.subject | UNCOOLED BOLOMETER | - |
dc.subject | NOISE | - |
dc.subject | ARRAYS | - |
dc.subject | TI | - |
dc.subject | DETECTORS | - |
dc.subject | XPS | - |
dc.title | Bolometric properties of reactively sputtered TiO2-x films for thermal infrared image sensors | - |
dc.type | Article | - |
dc.identifier.wosid | 000359714700006 | - |
dc.identifier.scopusid | 2-s2.0-84939142574 | - |
dc.type.rims | ART | - |
dc.citation.volume | 48 | - |
dc.citation.issue | 35 | - |
dc.citation.publicationname | JOURNAL OF PHYSICS D-APPLIED PHYSICS | - |
dc.identifier.doi | 10.1088/0022-3727/48/35/355104 | - |
dc.contributor.localauthor | Lee, Hee Chul | - |
dc.contributor.nonIdAuthor | Reddy, Y. Ashok Kumar | - |
dc.contributor.nonIdAuthor | Kang, In-Ku | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | TiO2-x heat-sensitive layer | - |
dc.subject.keywordAuthor | oxygen stoichiometry | - |
dc.subject.keywordAuthor | bolometer | - |
dc.subject.keywordAuthor | temperature coefficient of resistance | - |
dc.subject.keywordAuthor | 1/f noise parameter | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | UNCOOLED BOLOMETER | - |
dc.subject.keywordPlus | NOISE | - |
dc.subject.keywordPlus | ARRAYS | - |
dc.subject.keywordPlus | TI | - |
dc.subject.keywordPlus | DETECTORS | - |
dc.subject.keywordPlus | XPS | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.